The ZEISS SIGMA series of field emission scanning electron microscopes brings you unparalleled resolution, contrast and brightness for imaging highly topographical samples.
It features high vacuum and variable pressure modes of operation for high definition imaging of conducting and non-conducting samples.
ZEISS SIGMA can resolve structures down to 1.5nm with the optional HD functionality providing resolution down to 1.0nm. Use ZEISS SIGMA for such applications as resolving nanostructured surface detail on non-conducting samples with exceptional surface topography, obtaining high resolution TEM-like images of structural information on thin sections of metallic samples, measuring size of particles on non-conductive filters, and investigate failure mechanisms in materials and identifying fracture points.
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