ZEISS Crossbeam FIB-SEM Microscope combines low kV SEM performance with FIB currents up to 100 nA for nanotomography and nanofabrication. Use use multi-detector acquisition and experience the ability to mill and image simultaneously.
Visualize extremely large fields of view, up to 50 k x 40 k pixels, with the optional ATLAS 3D package. Upgrade with an optional laser for the the fastest technology for massive ablation. In combination with the high current FIB, fabricate functional structures such as microfluidic devices and MEMS ranging from the millimeter to the nanometer range.
Open up deeply buried target areas or trim soft samples where mechanical preparation causes smearing, delamination or compression.
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