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JPK launches the fast-scanning & super-resolution NanoWizard ULTRA Speed AFM system
JPK launches the fast-scanning & super-resolution NanoWizard ULTRA Speed AFM system
JPK Instruments AG
11/12/2013

Berlin, 10th December 2013: JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces the release of the next generation of NanoWizard® AFM systems delivering fast-scanning and super-resolution on an inverted microscope. The boundaries for performance of analytical instrumentation are continually being pushed to the limits. In the world of atomic force microscopy, AFM, JPK Instruments have...
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